On the distribution of extrinsic L-values in gray-mapped 16-QAM


In this paper we address the issue of probabilistic modelling of the extrinsic L-values, used as reliability metrics in the context of bit interleaved coded modulation with iterative demapping (BICM-ID). Starting with a simple piece-wise linear model of the L-values obtained via the max-log approximation, we derive the expressions for the cumulative… (More)
DOI: 10.1145/1280940.1281011


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