On techniques for handling soft errors in digital circuits

Abstract

Dealing with soft errors due to particle strikes is the next major challenge in implementing digital systems. This study thoroughly investigates the effect of device size on circuit soft error rate and identifies methods to reduce soft error rate in combinational circuits. In particular, we propose three novel methods that upsize only selected gates and /or… (More)
DOI: 10.1109/TEST.2010.5699278

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