On reset based functional broadside tests

  title={On reset based functional broadside tests},
  author={Irith Pomeranz and Sudhakar M. Reddy},
  journal={2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)},
Functional broadside tests were defined to avoid overtesting that may occur under structural scan-based tests. Overtesting occurs due to nonfunctional operation conditions created by unreachable scan-in states. Functional broadside tests were computed assuming that functional operation starts after the circuit is synchronized. We discuss the definition of functional broadside tests for the case where hardware reset is used for bringing the circuit into a known state before functional operation… CONTINUE READING
Highly Cited
This paper has 33 citations. REVIEW CITATIONS

From This Paper

Figures, tables, and topics from this paper.
27 Citations
0 References
Similar Papers


Publications citing this paper.

Similar Papers

Loading similar papers…