On hazard-free patterns for fine-delay fault testing


This work proposes an effective method for applying fine-delay fault testing in order to improve defect coverage of especially resistive opens. The method is based on grouping conventional delay-fault patterns into sets of almost equal-length paths. This narrows the overall path length distribution and allows running the pattern sets at a higher speed, thus… (More)
DOI: 10.1109/ITC.2004.128


16 Figures and Tables


Citations per Year

88 Citations

Semantic Scholar estimates that this publication has 88 citations based on the available data.

See our FAQ for additional information.