On error tolerance and Engineering Change with Partially Programmable Circuits

@article{Mangassarian2012OnET,
  title={On error tolerance and Engineering Change with Partially Programmable Circuits},
  author={Hratch Mangassarian and Hiroaki Yoshida and Andreas G. Veneris and Shigeru Yamashita and Masahiro Fujita},
  journal={17th Asia and South Pacific Design Automation Conference},
  year={2012},
  pages={695-700}
}
The growing size, density and complexity of modern VLSI chips are contributing to an increase in hardware faults and design errors in the silicon, decreasing manufacturing yield and increasing the design cycle. The use of Partially Programmable Circuits (PPCs) has been recently proposed for yield enhancement with very small overhead. This new circuit structure is obtained from conventional logic by replacing some subcircuits with programmable LUTs. The present paper lays the theoretical… CONTINUE READING

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