On diagnosis of faults in a scan-chain

@inproceedings{Kundu1993OnDO,
  title={On diagnosis of faults in a scan-chain},
  author={Sandip Kundu},
  booktitle={VTS},
  year={1993}
}
Testing screens for good chips. However, when test fall out is high (low yield) it becomes necessary to diagnose faults so that the manufacturing process or physical design can be fixed to improve yield. Several scan based diagnostic schemes are used in industry. They work when the scan chain itself is fault free. In this paper we describe a diagnosis system that can diagnose faults in a scan chain. 
Highly Cited
This paper has 62 citations. REVIEW CITATIONS

From This Paper

Figures, tables, and topics from this paper.
41 Citations
2 References
Similar Papers

Citations

Publications citing this paper.
Showing 1-10 of 41 extracted citations

63 Citations

0510'98'02'07'12'17
Citations per Year
Semantic Scholar estimates that this publication has 63 citations based on the available data.

See our FAQ for additional information.

References

Publications referenced by this paper.
Showing 1-2 of 2 references

Diagnosis of BIST failures by PPSFP simulation

  • P. Gupta, S. T. Patel
  • Proc. of Int. Test Conference,
  • 1987

Similar Papers

Loading similar papers…