On diagnosis of faults in a scan-chain

  title={On diagnosis of faults in a scan-chain},
  author={Sandip Kundu},
Testing screens for good chips. However, when test fall out is high (low yield) it becomes necessary to diagnose faults so that the manufacturing process or physical design can be fixed to improve yield. Several scan based diagnostic schemes are used in industry. They work when the scan chain itself is fault free. In this paper we describe a diagnosis system that can diagnose faults in a scan chain. 
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Diagnosis of BIST failures by PPSFP simulation

  • P. Gupta, S. T. Patel
  • Proc. of Int. Test Conference,
  • 1987

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