On automatic testpoint insertion in sequential circuits

@inproceedings{Gundlach1990OnAT,
  title={On automatic testpoint insertion in sequential circuits},
  author={Harald Gundlach and Klaus D. M{\"u}ller-Glaser},
  booktitle={ITC},
  year={1990}
}
Present design automation tools are not able in general t o predict efficient changes in digital circuits t o make them testable by Sequential ATPG-algorithms. An algorithm is presented which is based on the knowledge of reconvergencies and cycles in the circuit. It identifies a set of locations within the circuit, into which "test-cells" should be placed to improve testability. The results on sequential ATPG-benchmarks are compared with data supported by a commercially available testpattern… CONTINUE READING

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