On Using Machine Learning for Logic BIST

  title={On Using Machine Learning for Logic BIST},
  author={Christophe Fagot and Patrick Girard and Christian Landrault},
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate efficient patterns to be used during BIST test pattern generation. The main idea is that test patterns detecting random pattern resistant faults are not embedded in a pseudo–random sequence as in existing techniques, but rather are used to produce relevant features allowing to generate directed random test patterns that… CONTINUE READING


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