On Testing for Goodness-of-Fit of the Negative Binomial Distribution when Expectations are Small

@article{Pahl1969OnTF,
  title={On Testing for Goodness-of-Fit of the Negative Binomial Distribution when Expectations are Small},
  author={P. Pahl},
  journal={Biometrics},
  year={1969},
  volume={25},
  pages={143}
}
  • P. Pahl
  • Published 1969
  • Mathematics
  • Biometrics
In the case of fitting the negative binomial distribution, it is shown, by means of an example, that (a) the method of Nass [1959] provides a more suitable goodness-of-fit criterion than either Pearson's X2 statistic or the log-likelihood ratio; (b) the scope and power of all three criteria are considerably enhanced by relaxing the commonly used rule that all frequency classes should have an expectation greater than 5. 
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