On Testing for Goodness-of-Fit of the Negative Binomial Distribution when Expectations are Small

@article{Pahl1969OnTF,
title={On Testing for Goodness-of-Fit of the Negative Binomial Distribution when Expectations are Small},
author={P. Pahl},
journal={Biometrics},
year={1969},
volume={25},
pages={143}
}

In the case of fitting the negative binomial distribution, it is shown, by means of an example, that (a) the method of Nass [1959] provides a more suitable goodness-of-fit criterion than either Pearson's X2 statistic or the log-likelihood ratio; (b) the scope and power of all three criteria are considerably enhanced by relaxing the commonly used rule that all frequency classes should have an expectation greater than 5.