On-Line and Off-Line Testing: From Digital to Analog, from Circuits to Boards

@article{Courtois1995OnLineAO,
  title={On-Line and Off-Line Testing: From Digital to Analog, from Circuits to Boards},
  author={B. Courtois and Marcelo Lubaszewski},
  journal={ESSCIRC '95: Twenty-first European Solid-State Circuits Conference},
  year={1995},
  pages={34-37}
}
The goal of this paper is to review the design of circuits and systems featuring testing capabilities. Those capabilities include self-checking properties necessary for on-line testing as well as BIST. The design of fail-safe reliable ASICs and boards is broadly addressed. The basic milestones over the last 25 years are reviewed and longterm perspectives… CONTINUE READING