On Compaction Utilizing Inter and Intra-Correlation of Unknown States

@article{Czysz2010OnCU,
  title={On Compaction Utilizing Inter and Intra-Correlation of Unknown States},
  author={Dariusz Czysz and Grzegorz Mrugalski and Nilanjan Mukherjee and Janusz Rajski and Jerzy Tyszer},
  journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems},
  year={2010},
  volume={29},
  pages={117-126}
}
Unknown (X) states are increasingly often identified as having potential for rendering semiconductor tests useless. One of the key requirements for a reliable test response compactor is, therefore, to preserve observability of any scan cell for a wide range of X-profiles while maintaining very high-compaction ratios, providing ability to detect a variety of failures found in real silicon, and assuring design simplicity. We have proposed a fully X-tolerant test response compaction scheme which… CONTINUE READING
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Multistage test response compactors

  • J. Rajski, J. Tyszer, G. Mrugalski, W.-T. Cheng, M. Kassab
  • U.S. Patent Application 20070234157, Oct. 4, 2007…
  • 2007
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