On-Chip sensors to measure level of transient events

Abstract

On-die circuits were developed to measure the size of transient electrical events experienced at I/O pads. The circuits allow an integrated circuit (IC) to determine the peak voltages across the electrostatic discharge diodes during the event. Experiments and simulations with a 90 nm test chip show the sensor can determine the peak magnitude of the… (More)

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Cite this paper

@article{Patnaik2017OnChipST, title={On-Chip sensors to measure level of transient events}, author={Alok R. Patnaik and Mitesh Suchak and Rosemary R. Seva and Kiranmayee Pamidimukkala and Greg Edgington and Robert C Moseley and J. Feddeler and M. Stockinger and Daryl G. Beetner}, journal={2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)}, year={2017}, pages={1-10} }