On-Chip Adaptive Body Bias for Reducing the Impact of NBTI on 6T SRAM Cells

@article{Shah2018OnChipAB,
  title={On-Chip Adaptive Body Bias for Reducing the Impact of NBTI on 6T SRAM Cells},
  author={Ambika Prasad Shah and Nandakishor Yadav and Ankur Beohar and Santosh Kumar Vishvakarma},
  journal={IEEE Transactions on Semiconductor Manufacturing},
  year={2018},
  volume={31},
  pages={242-249}
}
Negative bias temperature instability (NBTI) is a major reliability issue with the scaled devices at elevated temperature. The effect of NBTI increases with the time, and it increases the threshold voltage of pMOS. In this paper, an on-chip adaptive body bias (O-ABB) circuit to compensate the degradation due to NBTI aging is presented. The O-ABB is used to… CONTINUE READING