Odd electron diffraction patterns in silicon nanowires and silicon thin films explained by microtwins and nanotwins

@inproceedings{Cayron2009OddED,
  title={Odd electron diffraction patterns in silicon nanowires and silicon thin films explained by microtwins and nanotwins},
  author={Cyril Cayron and Martien I den Hertog and Laurence Latu-Romain and C{\'e}line Mouchet and Christopher Secouard and J. L. Rouvi{\'e}re and Emmanuelle Rouvi{\`e}re and Jean-Pierre Simonato},
  booktitle={Journal of applied crystallography},
  year={2009}
}
Odd electron diffraction patterns (EDPs) have been obtained by transmission electron microscopy (TEM) on silicon nanowires grown via the vapour-liquid-solid method and on silicon thin films deposited by electron beam evaporation. Many explanations have been given in the past, without consensus among the scientific community: size artifacts, twinning artifacts or, more widely accepted, the existence of new hexagonal Si phases. In order to resolve this issue, the microstructures of Si nanowires… CONTINUE READING

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