OXYGEN K NEAR-EDGE-STRUCTURE FOR THIN CE OXIDE FILMS

@inproceedings{Braaten1991OXYGENKN,
  title={OXYGEN K NEAR-EDGE-STRUCTURE FOR THIN CE OXIDE FILMS},
  author={Nils A. Braaten and Anne Borg and Jostein K. Grepstad and Steinar Raaen and Mark W. Ruckman},
  year={1991}
}
Abstract Oxygen K -edge absorption studies are performed on thin oxidized Ce films on Ta substrates. The various absorption edges are identified as belonging to trivalent or tetravalent Ce oxides by use of previous photoemission results, and by use of the O K -edge absorption spectrum from formally tetravalent CeO 2 , which is obtained by oxidizing a thick Ce film. 

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