OPTICAL STUDIES OF PULSED LASER DEPOSITED PZT THIN FILM BY SPECTROSCOPIC ELLIPSOMETRY

@inproceedings{Franta2013OPTICALSO,
  title={OPTICAL STUDIES OF PULSED LASER DEPOSITED PZT THIN FILM BY SPECTROSCOPIC ELLIPSOMETRY},
  author={Daniel Paul Franta},
  year={2013}
}
The studies on the optical properties of PZT thin film are scarce compared to its studies on the ferroelectric property. When there are considerable reports on the optical properties of this material using the transmittance spectrum, only a few studies have been reported for the optical studies by spectroscopic ellipsometry (SE). Daniel Franta et al. [61] have prepared the sol-gel deposited Pb(Zr0.5Ti0.5)O3 PZT thin film on the Pt/Ti/SiO2/Si substrate and studied the spectral dependencies of… CONTINUE READING

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