Numerical simulation of nano scanning in intermittent-contact mode AFM under Q control.

@article{Varol2008NumericalSO,
  title={Numerical simulation of nano scanning in intermittent-contact mode AFM under Q control.},
  author={Aydin Varol and Ihsan Gunev and Bilal Orun and Cagatay Basdogan},
  journal={Nanotechnology},
  year={2008},
  volume={19 7},
  pages={075503}
}
We investigate nano scanning in tapping mode atomic force microscopy (AFM) under quality (Q) control via numerical simulations performed in SIMULINK. We focus on the simulation of the whole scan process rather than the simulation of cantilever dynamics and the force interactions between the probe tip and the surface alone, as in most of the earlier numerical studies. This enables us to quantify the scan performance under Q control for different scan settings. Using the numerical simulations, we… CONTINUE READING

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