Numerical Computation of Secondary Electron Emission Yield by a Two‐Fluxes Method

@inproceedings{Aoufi2009NumericalCO,
  title={Numerical Computation of Secondary Electron Emission Yield by a Two‐Fluxes Method},
  author={A. Aoufi and G. Damamme},
  year={2009}
}
The aim of this work is to study by numerical simulation a mathematical modelling describing charge trapping which occurs during charge injection in an insulator submitted to an electron beam irradiation. A modelling for the computation of the initial secondary electron emission yield (denoted by see) is presented based upon a set of coupled differential equations derived from a two‐fluxes method which combines forward and backward electrons fluxes. Existence, uniqueness and positivity of the… CONTINUE READING

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