Novel materials solutions and simulations for nanoelectromechanical switches

@article{Streller2015NovelMS,
  title={Novel materials solutions and simulations for nanoelectromechanical switches},
  author={Frank Streller and Graham E. Wabiszewski and Daniel B. Durham and Fan Yang and Jing Yang and Yubo Qi and David J. Srolovitz and Andrew M. Rappe and Robert W. Carpick},
  journal={2015 IEEE 61st Holm Conference on Electrical Contacts (Holm)},
  year={2015},
  pages={363-369}
}
Nanoelectromechanical (NEM) switches are a candidate to replace solid-state transistors due to their low power consumption. However, the reliability of the contact interface limits the commercialization of NEM switches, since for practical purposes, the electrical contact should be able to physically open and close up to a quadrillion (1015) times without failing due to adhesion (by sticking shut) or contamination (reducing switch conductivity). These failure mechanisms are not well understood… CONTINUE READING

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