Novel applications of deep learning hidden features for adaptive testing

Abstract

Adaptive test of integrated circuits (IC) promises to increase the quality and yield of products with reduced manufacturing test cost compared to traditional static test flows. Two mostly widely used techniques are Statistical Process Control (SPC) and Part Average Testing (PAT), whose capabilities to capture complex correlation between test measurements… (More)
DOI: 10.1109/ASPDAC.2016.7428100

Topics

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