Novel MMIC Source-Impedance Tuners for On-Wafer Microwave Noise-Parameter Measurements - Microwave Theory and Techniques, IEEE Transactions on

Abstract

Novel monolithic-microwave integrated-circuit source-impedance tuners for use in on-wafer noise-parameter measurement systems are reported, which can be incorporated into a wafer probe tip. These eliminate the effect of cable and probe losses on the magnitude of a reflection coefficient that can be presented to the input of an on-wafer test device, thus enabling higher magnitudes to be synthesized than for conventional tuners, and with the potential of increasing noise-parameter measurement accuracy.

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Cite this paper

@inproceedings{McIntosh1999NovelMS, title={Novel MMIC Source-Impedance Tuners for On-Wafer Microwave Noise-Parameter Measurements - Microwave Theory and Techniques, IEEE Transactions on}, author={Caroline E. McIntosh and Roger D. Pollard and Robert E. Miles}, year={1999} }