Novel Application of Focused Ion Beam Electron Microscopy (fib-em) in Preparation and Analysis of Microfossil Ultrastructures: a New View of Complexity in Early Eukaryotic Organisms

@inproceedings{Schiffbauer2009NovelAO,
  title={Novel Application of Focused Ion Beam Electron Microscopy (fib-em) in Preparation and Analysis of Microfossil Ultrastructures: a New View of Complexity in Early Eukaryotic Organisms},
  author={James D. Schiffbauer and Shuhai Xiao},
  year={2009}
}
Coupled dual-beam focused ion beam electron microscopy (FIB-EM) has gained popularity across multiple disciplines over the past decade. Widely utilized as a stand-alone instrument for micromachining and metal or insulator deposition in numerous industries, the submicron-scale ion milling and cutting capabilities of FIB-EM systems have been well documented in the materials science literature. These capacities make FIB-EM a powerful tool for in situ, site-specific transmission electron microscopy… CONTINUE READING
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