Normal and Reverse Temperature Dependence in Variation-Tolerant Nanoscale Systems with High-k Dielectrics and Metal Gates

@inproceedings{Wolpert2008NormalAR,
  title={Normal and Reverse Temperature Dependence in Variation-Tolerant Nanoscale Systems with High-k Dielectrics and Metal Gates},
  author={David Wolpert and Paul Ampadu},
  booktitle={NanoNet},
  year={2008}
}
The delay dependence on temperature reverses at increasingly larger supply voltages as technology scales into the nanometer regime, causing delay to decrease as temperature increases. This reversal can be problematic for variation-tolerant systems using critical path replicas to determine delay guardbands, as delay may no longer indicate when the system is in danger of thermal runaway. Adaptive voltage scaling, commonly used in variation-tolerant systems, further complicates the temperature… 
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