Nonlinear intensity attenuation with increasing thickness and quantitative TEM tomography of micron-sized materials.

Abstract

Nowadays three-dimensional (3D) analyses of nanometer-sized and sub-micron-sized objects have been widely achieved by tomography in transmission electron microscopes (TEM). One of the next methodological targets should be quantitative 3D reconstructions in which not only the shape but also the internal density is correctly reproduced. This is, however… (More)
DOI: 10.1093/jmicro/dfu044

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