Noninvasive Fault Classification, Robustness and Recovery Time Measurement in Microprocessor-Type Architectures Subjected to Radiation-Induced Errors

@article{GuzmnMiranda2009NoninvasiveFC,
  title={Noninvasive Fault Classification, Robustness and Recovery Time Measurement in Microprocessor-Type Architectures Subjected to Radiation-Induced Errors},
  author={Hip{\'o}lito Guzm{\'a}n-Miranda and Miguel A. Aguirre and Jonathan Noel Tombs},
  journal={IEEE Transactions on Instrumentation and Measurement},
  year={2009},
  volume={58},
  pages={1514-1524}
}
In critical digital designs such as aerospace or safety equipment, radiation-induced upset events (single-event effects or SEEs) can produce adverse effects, and therefore, the ability to compare the sensitivity of various proposed solutions is desirable. As custom-hardened microprocessor solutions can be very costly, the reliability of various commercial off-the-shelf (COTS) processors can be evaluated to see if there is a commercially available microprocessor or microprocessor-type… CONTINUE READING
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