Non-intrusive integration of advanced diagnosis features in automotive E/E-architectures


With ever more complex automotive systems, the current approach of using functional tests to locate faulty components results in very long analysis procedures and poor diagnostic accuracy. Built-In Self-Test (BIST) offers a promising alternative to collect structural diagnostic information during E/E-architecture test. However, as the automotive industry is… (More)


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@article{Abelein2014NonintrusiveIO, title={Non-intrusive integration of advanced diagnosis features in automotive E/E-architectures}, author={Ulrich Abelein and Alejandro Cook and Piet Engelke and Michael Gla\ss and Felix Reimann and Laura Rodr{\'i}guez G{\'o}mez and Thomas Russ and J{\"u}rgen Teich and Dominik Ull and Hans-Joachim Wunderlich}, journal={2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)}, year={2014}, pages={1-6} }