Non-Destructive Analysis of Artifacts by Using XRF, FTIR, and SEM/EDX

@inproceedings{Schreiner2004NonDestructiveAO,
  title={Non-Destructive Analysis of Artifacts by Using XRF, FTIR, and SEM/EDX},
  author={Manfred Schreiner and Dubravka Jembrih and Robert Linke and Michael Mantler},
  year={2004}
}

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