New techniques for functional testing of microprocessor based systems

@inproceedings{Cantoro2017NewTF,
  title={New techniques for functional testing of microprocessor based systems},
  author={Riccardo Cantoro},
  year={2017}
}
Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any… Expand

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