# New capabilities for predicting image degradation from optical surface metrology data

@inproceedings{Choi2010NewCF, title={New capabilities for predicting image degradation from optical surface metrology data}, author={Narak Choi and J. E. Harvey and A. Krywonos}, booktitle={Optical Engineering + Applications}, year={2010} }

Image degradation due to scattered radiation form residual optical fabrication errors is a serious problem in many short wavelengths imaging system. Most currently-available image analysis codes require the bidirectional scattering distribution function (BSDF) data as an input in order to calculate the image quality from such systems. This BSDF data is difficult to measure and rarely available for the operational wavelengths of interest. Since the smooth-surface approximation is often not… Expand

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