New approaches for the repairs of memories with redundancy by row/column deletion for yield enhancement

@article{Huang1990NewAF,
  title={New approaches for the repairs of memories with redundancy by row/column deletion for yield enhancement},
  author={Wei-Kang Huang and Yinan N. Shen and Fabrizio Lombardi},
  journal={IEEE Trans. on CAD of Integrated Circuits and Systems},
  year={1990},
  volume={9},
  pages={323-328}
}
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