New Techniques for Deterministic Test Pattern Generation

@article{Hamzaoglu1998NewTF,
  title={New Techniques for Deterministic Test Pattern Generation},
  author={Ilker Hamzaoglu and Janak H. Patel},
  journal={Journal of Electronic Testing},
  year={1998},
  volume={15},
  pages={63-73}
}
This paper presents new techniques for speeding up deterministic test pattern generation for VLSI circuits. These techniques improve the PODEM algorithm by reducing number of backtracks with a low computational cost. This is achieved by finding more necessary signal line assignments, by detecting conflicts earlier, and by avoiding unnecessary work during test generation. We have incorporated these techniques into an advanced ATPG system for combinational circuits, called ATOM. The performance… CONTINUE READING
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