New Current Monitor Using Auto Zero Voltage Comparator for IDD Testing of Mixed-signal Circuits

@article{Nagy2006NewCM,
  title={New Current Monitor Using Auto Zero Voltage Comparator for IDD Testing of Mixed-signal Circuits},
  author={Vladislav Nagy and Viera Stopjakov{\'a}},
  journal={2006 IEEE Design and Diagnostics of Electronic Circuits and systems},
  year={2006},
  pages={234-235}
}
An. approach to the dynamic supply current sensing based on the measurement of voltage drop across a parasitic resistance of the supply voltage metal routing is presented. Auto-zero technique for voltage comparator offset cancellation, which provides very accurate and sensitive low voltage drop measurement is proposed. Therefore, one may use the proposed sensor as a current monitor for dynamic current testing of mixed-signal circuits without any additional element necessarily connected in… CONTINUE READING

Citations

Publications citing this paper.

Built-In Current Monitor for IDDQ Testing in CMOS 90 nm Technology

  • 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
  • 2008

References

Publications referenced by this paper.
SHOWING 1-6 OF 6 REFERENCES

Efficient Current Monitors for on-line Testing of Systems on Chip

P. Dziurdzia
  • Proc. of the 11 International Conference MIXDES,
  • 2004
VIEW 1 EXCERPT

Auto-zero stabilized CMOS amplifiers for very low voltage or current offset

  • 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515)
  • 2003
VIEW 1 EXCERPT

An On-Chip Dynamic Current Monitor for Iddt Testing

V. Stopjakova, H. Manhaeve
  • Proc. of IEEE European Test Workshop,
  • 1998
VIEW 1 EXCERPT