Neutron induced single event multiple transients with voltage scaling and body biasing

@article{Harada2011NeutronIS,
  title={Neutron induced single event multiple transients with voltage scaling and body biasing},
  author={Ryo Harada and Yukio Mitsuyama and Masanori Hashimoto and Takao Onoye},
  journal={2011 International Reliability Physics Symposium},
  year={2011},
  pages={3C.4.1-3C.4.5}
}
This paper presents measurement results of neutron induced SEMT (single event multiple transients). We devise an SEMT measurement circuit and evaluate the dependency of SEMT on supply and body voltages using test chips fabricated in a 65nm CMOS process. Measurement results show that transients can arise simultaneously at adjacent six inverters sharing the same well, and SEMT ratio to all the single event transients reaches 40% at 0.7V with reverse body biasing. We also investigate the… CONTINUE READING
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Measurement and reporting of alpha rarticles and terrestrial cosmic ray-induced soft errors in semiconductor devices

  • JEDEC standard JESD89
  • 2001. 3c.4.5 IRPS11-257
  • 2001
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