Neutron Induced Micro SEL Events in COTS SRAM Devices

@article{Tausch2007NeutronIM,
  title={Neutron Induced Micro SEL Events in COTS SRAM Devices},
  author={J. Tausch and D. Sleeter and D. Radaelli and Helmut Puchner},
  journal={2007 IEEE Radiation Effects Data Workshop},
  year={2007},
  volume={0},
  pages={185-188}
}
This paper provides experimental details of micro-latchup occurrences in SRAM circuitry caused by exposure to neutron irradiation similar to that seen at sea level (terrestrial neutrons). Design enhancements are identified that eliminated the problem. 
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References

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Measurement and Reporting of Alpha Particle and Terrestrial Cosmic RayInduced Soft Errors in Semiconductor Devices ”

  • D. J. Sleeter, E. W. Enlow
  • JEDEC STANDARD JESD
  • 2006

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