Negative capacitance effect in semiconductor devices

@inproceedings{MErshov1998NegativeCE,
  title={Negative capacitance effect in semiconductor devices},
  author={M.Ershov and H.C.Liu and L.Li and M.Buchanan and Z.R.Wasilewski and A.K.Jonscher},
  year={1998}
}
Nontrivial capacitance behavior, including a negative capacitance (NC) effect, observed in a variety of semiconductor devices, is discussed emphasizing the physical mechanism and the theoretical interpretation of experimental data. The correct interpretation of NC can be based on the analysis of the time-domain transient current in response to a small voltage step or impulse, involving a self-consistent treatment of all relevant physical effects (carrier transport, injection, recharging etc… 
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