Negative bias temperature instability: What do we understand?

@article{Schroder2007NegativeBT,
  title={Negative bias temperature instability: What do we understand?},
  author={Dieter K. Schroder},
  journal={Microelectronics Reliability},
  year={2007},
  volume={47},
  pages={841-852}
}
We present a brief overview of negative bias temperature instability (NBTI) commonly observed for in p-channel metal–oxide–semiconductor field-effect transistors (MOSFETs) when stressed with negative gate voltages at elevated temperatures and discuss the results of such stress on device and circuit performance and review interface traps and oxide charges, their origin, present understanding, and changes due to NBTI. Next we discuss some of the models that have been proposed for both NBTI… CONTINUE READING
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