Near surface defects: Cause of deficit between internal and external open‐circuit voltage in solar cells

@article{Sood2021NearSD,
  title={Near surface defects: Cause of deficit between internal and external open‐circuit voltage in solar cells},
  author={Mohit Sood and Aleksander Urbaniak and Christian Kameni Boumenou and Thomas Paul Weiss and Hossam Elanzeery and Finn Babbe and Florian Werner and Michele Melchiorre and Susanne Siebentritt},
  journal={Progress in Photovoltaics: Research and Applications},
  year={2021},
  volume={30},
  pages={263 - 275}
}
Interface recombination in a complex multilayered thin‐film solar structure causes a disparity between the internal open‐circuit voltage (VOC,in), measured by photoluminescence, and the external open‐circuit voltage (VOC,ex), that is, a VOC deficit. Aspirations to reach higher VOC,ex values require a comprehensive knowledge of the connection between VOC deficit and interface recombination. Here, a near‐surface defect model is developed for copper indium di‐selenide solar cells grown under Cu… 
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Today's perovskite solar cells (PSCs) are limited mainly by their open‐circuit voltage (VOC) due to nonradiative recombination. Therefore, a comprehensive understanding of the relevant recombination
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