Near-field microscopy by elastic light scattering from a tip

  title={Near-field microscopy by elastic light scattering from a tip},
  author={Fritz Keilmann and Rainer Hillenbrand},
  journal={Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences},
  pages={787 - 805}
  • F. Keilmann, R. Hillenbrand
  • Published 15 April 2004
  • Physics
  • Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences
We describe ultraresolution microscopy far beyond the classical Abbe diffraction limit of one half wavelength (λ/2), and also beyond the practical limit (ca. λ/10) of aperture–based scanning near–field optical microscopy (SNOM). The ‘apertureless’ SNOM discussed here uses light scattering from a sharp tip (hence scattering–type or s–SNOM) and has no λ–related resolution limit. Rather, its resolution is approximately equal to the radius a of the probing tip (for commercial tips, a<20 nm) so that… 
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