Near-field microscopy by elastic light scattering from a tip

@article{Keilmann2004NearfieldMB,
  title={Near-field microscopy by elastic light scattering from a tip},
  author={Fritz Keilmann and Rainer Hillenbrand},
  journal={Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences},
  year={2004},
  volume={362},
  pages={787 - 805}
}
  • F. Keilmann, R. Hillenbrand
  • Published 15 April 2004
  • Physics
  • Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences
We describe ultraresolution microscopy far beyond the classical Abbe diffraction limit of one half wavelength (λ/2), and also beyond the practical limit (ca. λ/10) of aperture–based scanning near–field optical microscopy (SNOM). The ‘apertureless’ SNOM discussed here uses light scattering from a sharp tip (hence scattering–type or s–SNOM) and has no λ–related resolution limit. Rather, its resolution is approximately equal to the radius a of the probing tip (for commercial tips, a<20 nm) so that… 
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References

SHOWING 1-10 OF 67 REFERENCES
Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy
Near-field probing of vibrational absorption for chemical microscopy
Identification of chemical compounds by vibrational spectroscopy at infrared wavelengths requires macroscopic samples: the spatial resolution is diffraction-limited to a scale of about half the
Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale
TLDR
A near-field probe has been developed that yields a resolution of ∼12 nm (∼λ/43) and signals ∼104- to 106-fold larger than those reported previously and image contrast is demonstrated to be highly polarization dependent.
Material contrast in scanning near-field optical microscopy at 1–10 nm resolution
The tetrahedral tip is used as a light emitting probe for scanning near-field optical microscopy (SNOM). It has no aperture as an element for the confinement of light and the techniques of scanning
Performance of visible and mid‐infrared scattering‐type near‐field optical microscopes
TLDR
The results show that the imaging process of s‐SNOM is wavelength‐independent, namely, that the resolution is determined by the properties of the tip only, and that the contrast is given by the complex refractive index of the sample, predictable from a simple, analytical model of tip–sample interaction.
Observation of nanometer-scale optical property discrimination by use of a near-field scanning apertureless microscope.
TLDR
It is concluded that near-field scanning apertureless microscopy not only meets the criteria for a NFO image but also is capable of measuring optical properties below the diffraction limit.
Apertureless Scanning Near-Field Infrared Microscopy of a Rough Polymeric Surface
Infrared near-field microscopy using an apertureless probe technique has been accomplished to study the surface of a cast copolymer film. Two basic models for the predicted signal and the
Pure optical contrast in scattering‐type scanning near‐field microscopy
We have enhanced the apertureless scattering‐type scanning near‐field optical microscope by two improvements which together achieve a recording of the true near field without any height‐induced
Mid‐infrared scanning near‐field optical microscope resolves 30 nm
TLDR
The performance of a scanning near‐field infrared microscope is explored, which works by scattering tightly focused CO2 laser radiation from the apex of a metallized atomic force microscope tip, and it is observed that the infrared contrast vanishes when the input beam polarization is orthogonal to the tip axis.
Near-field scanning optical microscope with a metallic probe tip.
TLDR
A near-field scanning optical microscope with a metallic probe tip was developed for detecting localized photons near the surface of the fine structure of a sample and the removal of stray-light noise contribution.
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