Near-Field Electromagnetic Characterization and Perturbation of Logic Circuits

@article{Dubois2008NearFieldEC,
  title={Near-Field Electromagnetic Characterization and Perturbation of Logic Circuits},
  author={Tristan Dubois and Sylvie Jarrix and Annick Penarier and Philippe Nouvel and Daniel Gasquet and Laurent Chusseau and Bruno Aza{\"i}s},
  journal={IEEE Transactions on Instrumentation and Measurement},
  year={2008},
  volume={57},
  pages={2398-2404}
}
We propose here a nondestructive electromagnetic (EM) near-field test bench for both EM compatibility and susceptibility of circuits. This setup permits both the collection of the near field and injection without contact of a disturbing EM field, all through a probe. Exhaustive characterizations of probes are undertaken via simulations and experiments. According to their design, they are supposedly linked more to the electric or the magnetic field. Simulations of their EM behavior are undergone… CONTINUE READING
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