Nber Working Paper Series Are All Patent Examiners Equal? the Impact of Characteristics on Patent Statistics and Litigation Outcomes

Abstract

Building on insights gained from interviewing administrators and patent examiners at the United States Patent and Trademark Office (USPTO), we collect and analyze a novel dataset on patent examiners and patent outcomes. This dataset is based on 182 patents for which the Court of Appeals for the Federal Circuit (CAFC) ruled on validity between 1997 and 2000… (More)

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Cite this paper

@inproceedings{Cockburn2002NberWP, title={Nber Working Paper Series Are All Patent Examiners Equal? the Impact of Characteristics on Patent Statistics and Litigation Outcomes}, author={Iain M. Cockburn and Samuel Kortum and Scott Stern}, year={2002} }