Nanowire probes for high resolution combined scanning electrochemical microscopy - atomic force microscopy.

@article{Burt2005NanowirePF,
  title={Nanowire probes for high resolution combined scanning electrochemical microscopy - atomic force microscopy.},
  author={David P Burt and Neil R Wilson and John M Weaver and Phillip S. Dobson and Julie V Macpherson},
  journal={Nano letters},
  year={2005},
  volume={5 4},
  pages={639-43}
}
We describe a method for the production of nanoelectrodes at the apex of atomic force microscopy (AFM) probes. The nanoelectrodes are formed from single-walled carbon nanotube AFM tips which act as the template for the formation of nanowire tips through sputter coating with metal. Subsequent deposition of a conformal insulating coating, and cutting of the probe end, yields a disk-shaped nanoelectrode at the AFM tip apex whose diameter is defined by the amount of metal deposited. We demonstrate… CONTINUE READING
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