Nanowire facilitated transfer of sensitive TEM samples in a FIB.

@article{Gorji2020NanowireFT,
  title={Nanowire facilitated transfer of sensitive TEM samples in a FIB.},
  author={Saleh Gorji and Ankush Kashiwar and Lakshmi Sravani Mantha and Robert Kruk and Ralf Witte and Peter L. Marek and Horst Hahn and Christian K{\"u}bel and Torsten Scherer},
  journal={Ultramicroscopy},
  year={2020},
  volume={219},
  pages={
          113075
        }
}
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References

SHOWING 1-10 OF 44 REFERENCES
FIB based fabrication of an operative Pt/HfO2/TiN device for resistive switching inside a transmission electron microscope.
fabrication of Long and Smooth Tungsten Probes for Nano-manipulation
Long and smooth tungsten probe is useful for nano-manipulation. In this paper, an ameliorated straightforward dynamic electrochemical etching method and process for long and smooth tungsten probe…
Novel in-situ lamella fabrication technique for in-situ TEM.
In situ lift-out dedicated techniques using FIB-SEM system for TEM specimen preparation.
Double-tilt in situ TEM holder with multiple electrical contacts and its application in MEMS-based mechanical testing of nanomaterials.
MEMS-based sample carriers for simultaneous heating and biasing experiments: A platform for in-situ TEM analysis
  • H. H. P. Garza, Y. Pivak, Qiang Xu
  • Engineering
    2017 19th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS)
  • 2017
We present the development of a MEMS-based sample carrier to be used for in-situ studies inside the Transmission Electron Microscope (TEM). This MEMS device, referred to as the Nano-Chip, acts as a…
Ion beam heating of kinetically constrained nanomaterials.
Melt-spun thin ribbons of shape memory TiNiCu alloy for micromechanical applications
The development of micromechanical devices (MEMS and NEMS) on the basis of nanostructured shape memory alloys is reported. A Ti50Ni25Cu25 (at. %) alloy fabricated by the melt spinning technique in…
Design and implementation of shape memory alloy-actuated nanotweezers for nanoassembly
Reliable and accurate tools for nanoscale manipulation are constantly sought to complement new breakthroughs in nanomaterials and nanotechnology. In this study, a new design of electrically actuated…
In situ electron microscopy four-point electromechanical characterization of freestanding metallic and semiconducting nanowires.
TLDR
A novel micro-electro-mechanical system (MEMS) that allows integrated four-point, uniaxial, electromechanical measurements of freestanding nanostructures in-situ electron microscopy, is reported.
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