NIST Microcalorimeter Detector for High Resolution X-ray Detection CSTL Program : Industrial and Analytical Instruments and Services

@inproceedings{Marinenko2003NISTMD,
  title={NIST Microcalorimeter Detector for High Resolution X-ray Detection CSTL Program : Industrial and Analytical Instruments and Services},
  author={Ryna B. Marinenko and John T. Armstrong and Shane Robert Turner and Eric B. Steel and David S. Simons and Tetrachloroethene Chlorodifluoromethane and P H Backfilling and Justin Chi and Gillen and Rose Mar{\'i}a Hern{\'a}ndez and Stephan J. Stranick and Biomaterials and Sonya V Roberson and J Greg Gillen and Shih-Chin Yang and Philip T. Wilson and Lee J Richter and R. D. van Zee and Joshua J. Stapleton and David L. Allara and Joseph M. Conny and Donna B Klinedinst and Scott A. Wight and Jeffrey L Paulsen and Rebecca L. Fletcher and Julia A. King and Michael Small and James Winchester and Guo Wei Yang and Mulholland and R. A. Fletcher and Edgar S. Etz and Abigail P. Lindstrom and Cynthia J. Zeissler and Jennifer Verkouteren and Bruce A. Benner and R Lareau and Albert J Fahey and Cedric J. Powell and Francesc Salvat and Helen J. Scott and J BerechmanIL K A Small and Dale E. Newbury and Roger L. King and Terrence Jach and Sae Woo Nam and Kent D Irwin and S. Deiker and Emission Spectroscopy and An Sem and David S. Bright and Annabelle Wylie},
  year={2003}
}
A practical series of analytical and quality control procedures were developed and an evaluation of microprobe correction algorithms was made to provide a robust method to enable quantitative x-ray microanalysis to be performed at large, variable specimen tilt angles relative to the electron beam and x-ray detectors. The procedures and corrections explored were designed specifically to enable electron backscattered diffraction analysis (EBSD) and quantitative x-ray emission analysis (EDS/WDS… CONTINUE READING