Multiple tests for each gate delay fault: higher coverage and lower test application cost

@article{Irajpour2005MultipleTF,
  title={Multiple tests for each gate delay fault: higher coverage and lower test application cost},
  author={Shahdad Irajpour and Sandeep K. Gupta and Melvin A. Breuer},
  journal={IEEE International Conference on Test, 2005.},
  year={2005},
  pages={9 pp.-1219}
}
Different tests for a single gate delay fault can detect different ranges of delay fault sizes. It is of interests to determine whether, for most faults, a single test covers all the ranges of delay fault sizes covered collectively by all tests for the fault. Using an enhanced gate delay fault simulation algorithm, we show that for a considerable number of gate delay faults in benchmark circuits, multiple tests collectively provide more comprehensive coverage than any single test. We then… CONTINUE READING

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