Multiple-detect ATPG based on physical neighborhoods

  title={Multiple-detect ATPG based on physical neighborhoods},
  author={Jeffrey E. Nelson and Jason G. Brown and Rao Desineni and R. D. Blanton},
  journal={2006 43rd ACM/IEEE Design Automation Conference},
Multiple-detect test sets detect single stuck line faults multiple times, and thus have a higher probability of detecting complex defects. But current definitions of what constitutes a new test for a single stuck line fault do not leverage defect locality. Recent work has proposed a new metric to capture quality of a multiple-detect test set based on the number of unique states on lines in the physical neighborhood of a targeted line. This paper presents a new ATPG strategy that uses this… CONTINUE READING
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