Multipactor threshold sensitivity to Total Electron Emission Yield in parallel-plate waveguide and TEEY models accuracy


Multipactor effect can lead to RF components deterioration which could be fatal to RF systems in space communication payloads or in experimental fusion devices. To avoid such risk, oversized margins are used. Multipactor simulations are used to get voltage threshold predictions. Since the power breakdown depends on the Total Electron Emission Yield (TEEY… (More)


5 Figures and Tables