Multimode Scanning Probe Microscope System for Nanocomposite Actuators

@inproceedings{Enikov2002MultimodeSP,
  title={Multimode Scanning Probe Microscope System for Nanocomposite Actuators},
  author={Eniko T. Enikov},
  year={2002}
}
Abstract : This DURIP award has been issued for the acquisition of a scanning probe microscope system (SPM). Scanning Probe Microscopes are (SPMs) are used to probe material surfaces with atomic resolution. Unlike optical and electron microscopes, the SPMs reveal details not only in x- and y-directions but also along the z- axis, perpendicular to the surface. Typical lateral resolutions range from 20 Angstroms down to 1 Angstrom, while in the vertical direction the resolution is better than 1… CONTINUE READING