Multifrequency imaging in the intermittent contact mode of atomic force microscopy: beyond phase imaging.

@article{Guo2012MultifrequencyII,
  title={Multifrequency imaging in the intermittent contact mode of atomic force microscopy: beyond phase imaging.},
  author={Senli Guo and Santiago De Jesus Solares and Vadym Mochalin and Ioannis Neitzel and Yury Gogotsi and Sergei V. Kalinin and Stephen Jesse},
  journal={Small},
  year={2012},
  volume={8 8},
  pages={1264-9}
}
The cantilever dynamics in single-frequency scanning probe microscopy (SPM) are undefined due to having only two output variables, which leads to poorly understood image contrast. To address this shortcoming, generalized phase imaging scanning probe microscopy (GP-SPM), based on broad band detection and multi-eigenmode operation, is developed and… CONTINUE READING