Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits

Cite this paper

@article{Drmanac2011MultidimensionalPT, title={Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits}, author={Dragoljub Gagi Drmanac and Nik Sumikawa and LeRoy Winemberg and Li-C. Wang and Magdy S. Abadir}, journal={2011 Design, Automation & Test in Europe}, year={2011}, pages={1-6} }