Multi-pass transmission electron microscopy

@article{Juffmann2017MultipassTE,
  title={Multi-pass transmission electron microscopy},
  author={T. Juffmann and Stewart A. Koppell and B. Klopfer and C. Ophus and R. Glaeser and M. Kasevich},
  journal={Scientific Reports},
  year={2017},
  volume={7}
}
Feynman once asked physicists to build better electron microscopes to be able to watch biology at work. While electron microscopes can now provide atomic resolution, electron beam induced specimen damage precludes high resolution imaging of sensitive materials, such as single proteins or polymers. Here, we use simulations to show that an electron microscope based on a multi-pass measurement protocol enables imaging of single proteins, without averaging structures over multiple images. While we… Expand
Design for a 10 keV multi-pass transmission electron microscope.
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